A Fast-Transient-Response NMOS LDO with Wide Load-Capacitance Range for Cross-Point Memory

Abstract

In this paper, a fast-transient-response NMOS low-dropout regulator (LDO) with a wide load-capacitance range was presented to provide a V/2 read bias for cross-point memory. To utilize the large dropout voltage in the V/2 bias scheme, a fast loop consisting of NMOS and flipped voltage amplifier (FVA) topology was adopted with a fast transient response. This design is suitable to provide a V/2 read bias with 3.3 V input voltage and 1.65 V output voltage for different cross-point memories. The FVA-based LDO designed in the 110 nm CMOS process remained stable under a wide range of load capacitances from 0 to 10 nF and equivalent series resistance (ESR) conditions. At the capacitor-less condition, it exhibited a unity-gain bandwidth (UGB) of approximately 400 MHz at full load. For load current changes from 0 to 10 mA within an edge time of 10 ps, the simulated undershoot and settling time were only 144 mV and 50 ns, respectively. The regulator consumed 70 µA quiescent current and achieved a remarkable figure-of-merit (FOM) of 1.01 mV. At the ESR condition of a 1 µF off-chip capacitor, the simulated quiescent current, on-chip capacitor consumption, and current efficiency at full load were 8.5 µA, 2 pF, and 99.992%, respectively. The undershoot voltage was 20 mV with 800 ns settling time for a load step from 0 to 100 mA within the 10 ps edge time.