Abstract
Hardware-in-the-Loop (HIL) has been recommended by ISO 26262 as an essential test bench for determining the safety and reliability characteristics of automotive software systems (ASSs). However, due to the complexity and the huge amount of data recorded by the HIL platform during the testing process, the conventional data analysis methods used for detecting and classifying faults based on the human expert are not realizable. Therefore, the development of effective means based on the historical data set is required to analyze the records of the testing process in an efficient manner. Even though data-driven fault diagnosis is superior to other approaches, selecting the appropriate technique from the wide range of Deep Learning (DL) techniques is challenging. Moreover, the training data containing the automotive faults are rare and considered highly confidential by the automotive industry. Using hybrid DL techniques, this study proposes a novel intelligent fault detection and classification (FDC) model to be utilized during the V-cycle development process, i.e., the system integration testing phase. To this end, an HIL-based real-time fault injection framework is used to generate faulty data without altering the original system model. In addition, a combination of the Convolutional Neural Network (CNN) and Long Short-Term Memory (LSTM) is employed to build the model structure. In this study, eight types of sensor faults are considered to cover the most common potential faults in the signals of ASSs. As a case study, a gasoline engine system model is used to demonstrate the capabilities and advantages of the proposed method and to verify the performance of the model. The results prove that the proposed method shows better detection and classification performance compared to other standalone DL methods. Specifically, the overall detection accuracies of the proposed structure in terms of precision, recall and F1-score are 98.86%, 98.90% and 98.88%, respectively. For classification, the experimental results also demonstrate the superiority under unseen test data with an average accuracy of 98.8%.
Subject
Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Cited by
16 articles.
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