Low Threshold Current and Polarization-Stabilized 795 nm Vertical-Cavity Surface-Emitting Lasers
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Published:2023-03-21
Issue:6
Volume:13
Page:1120
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ISSN:2079-4991
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Container-title:Nanomaterials
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language:en
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Short-container-title:Nanomaterials
Author:
Fu Qiuxue1, Sun Yurun2, Yu Suzhen2, Wang Ancheng1, Yin Jiajing1, Zhao Yongming3, Dong Jianrong12ORCID
Affiliation:
1. School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, Hefei 230026, China 2. Key Laboratory of Nano Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou 215123, China 3. Dogain Laser Technology (Suzhou) Co., Ltd.; Suzhou 215000, China
Abstract
Low threshold current and polarization-stabilized 795 nm vertical-cavity surface-emitting lasers (VCSELs) are fabricated by integrating a surface grating of high polarization selectivity and high reflectivity. The rigorous coupled-wave analysis method is used to design the surface grating. For the devices with a grating period of 500 nm, a grating depth of ~150 nm, and a diameter of the surface grating region of 5 μm, a threshold current of 0.4 mA and an orthogonal polarization suppression ratio (OPSR) of 19.56 dB are obtained. The emission wavelength of 795 nm of a single transverse mode VCSEL is achieved at a temperature of 85 °C under an injection current of 0.9 mA. In addition, experiments demonstrate that the threshold and output power also depended on the size of the grating region.
Subject
General Materials Science,General Chemical Engineering
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