Polarimeters for the Detection of Anisotropy from Reflectance

Author:

Kamegaki Shuji1ORCID,Khajehsaeidimahabadi Zahra23,Ryu Meguya4ORCID,Le Nguyen Hoai An2,Ng Soon Hock2ORCID,Buividas Ričardas2,Seniutinas Gediminas2,Anand Vijayakumar5ORCID,Juodkazis Saulius267ORCID,Morikawa Junko168

Affiliation:

1. School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan

2. Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia

3. Aerostructures Innovation Research Hub (AIR Hub), Swinburne University of Technology, John St, Hawthorn, VIC 3122, Australia

4. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Ibaraki, Japan

5. Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia

6. WRH Program International Research Frontiers Initiative (IRFI), Tokyo Institute of Technology, Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Kanagawa, Japan

7. Laser Research Center, Physics Faculty, Vilnius University, Saulėtekio Ave. 10, 10223 Vilnius, Lithuania

8. Research Center for Autonomous Systems Materialogy (ASMat), Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8501, Kanagawa, Japan

Abstract

Polarimetry is used to determine the Stokes parameters of a laser beam. Once all four S0,1,2,3 parameters are determined, the state of polarisation is established. Upon reflection of a laser beam with the defined S polarisation state, the directly measured S parameters can be used to determine the optical properties of the surface, which modify the S-state upon reflection. Here, we use polarimetry for the determination of surface anisotropies related to the birefringence and dichroism of different materials, which have a common feature of linear patterns with different alignments and scales. It is shown that polarimetry in the back-reflected light is complementary to ellipsometry and four-polarisation camera imaging; experiments were carried out using a microscope.

Funder

Australian Research Council

Aerostructures Innovation Research (AIR) Hub at Swinburne University of Technology

JST CREST

Japan and JSPS KAKENHI

Grant-in-Aid for Early-Career Scientists

Publisher

MDPI AG

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3