Abstract
The operational expenditures of solar energy are gaining attention because of the continuous decrease of the capital expenditures. This creates a demand for more reliable systems to further decrease the costs. Increased reliability is often ensured by iterative use of design for reliability. The number of iterations that can take place strongly depends on the computational efficiency of this methodology. The main research objective is to quantify the influence of the temperature dependence of the electrical variables used in the electro-thermal model on the reliability and the computation time. The influence on the reliability is evaluated by using a 2-D finite elements method model of the MOSFET and calculating the plastic energy dissipation density in the die-attach and the bond wire. The trade-off between computation time of the electro-thermal model in PLECS (4.3, Plexim, Zurich, Switzerland) and generated plastic energy accuracy obtained in COMSOL (5.3, COMSOL Inc., Burlington, MA, USA) is reported when excluding a certain temperature dependence. The results indicate that the temperature dependence of the input and output capacitors causes no change in the plastic energy dissipated in the MOSFET but does introduce the largest increase in computation time. However, not including the temperature dependence of the MOSFET itself generates the largest difference in plastic energy of 10% as the losses in the die are underestimated.
Subject
Energy (miscellaneous),Energy Engineering and Power Technology,Renewable Energy, Sustainability and the Environment,Electrical and Electronic Engineering,Control and Optimization,Engineering (miscellaneous)
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