Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer-Reference-Cited by-同舟云学术

Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer

Published:2017-06-06 Issue:6 Volume:7 Page:584
ISSN:2076-3417
Container-title:Applied Sciences
language:en
Short-container-title:Applied Sciences

Author:

Inubushi Yuichi,Inoue Ichiro,Kim Jangwoo,Nishihara Akihiko,Matsuyama Satoshi,Yumoto Hirokatsu,Koyama Takahisa,Tono Kensuke,Ohashi Haruhiko,Yamauchi Kazuto,Yabashi Makina^ORCID

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Link

http://www.mdpi.com/2076-3417/7/6/584/pdf

Reference18 articles.

1. First lasing and operation of an ångstrom-wavelength free-electron laser

2. A compact X-ray free-electron laser emitting in the sub-ångström region

3. Femtosecond X-ray protein nanocrystallography

4. Native structure of photosystem II at 1.95 Å resolution viewed by femtosecond X-ray pulses

5. Atomic inner-shell laser at 1.5-ångström wavelength pumped by an X-ray free-electron laser

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