Probing the Deformation Mechanisms of Nanocrystalline Silver by In-Situ Tension and Synchrotron X-ray Diffraction

Abstract

The mechanisms responsible for the deformation of nanocrystalline materials are not well understood although many mechanisms have been proposed. This article studies the room-temperature stress-strain relations of bulk nanocrystalline silver deformed in a tension mode at a constant strain rate. Synchrotron X-ray diffraction patterns were gathered from the deformed specimen and used to deduce such structural parameters as the grain size and the density of dislocations, twins, and stacking faults. Our quantitative results indicate that grain growth and twinning occur in the stage of elastic deformation. Detwinning and accumulation of stacking faults occur in the early stage of plastic deformation, where the strength of nanocrystalline silver correlates well with the square root of stacking faults probability. Grain shrinking and generation of statistically stored dislocations occur in the final stage of plastic deformation, where the strength of nanocrystalline silver correlates well with the square root of the density of dislocations (statistically stored and geometrically necessary). Our results suggest that multiple deformation mechanisms such as grain growth, grain shrinking, twinning, detwinning, stacking faults, and dislocations, rather than a single deformation mechanism, occur in the elastic and plastic deformation stages of nanocrystalline silver.