The Influence of the ITO Layers’ Thicknesses on Their Chosen Physical Surface Parameters

Author:

Musztyfaga-Staszuk Małgorzata1ORCID,Gawlińska-Nęcek Katarzyna2ORCID,Socha Robert3ORCID,Panek Piotr2

Affiliation:

1. Welding Department, Silesian University of Technology, Konarskiego 18A, 44-100 Gliwice, Poland

2. Institute of Metallurgy and Materials Science PAS, Reymonta 25, 30-059 Krakow, Poland

3. Centrum Badań i Rozwoju Technologii dla Przemysłu S.A., Waryńskiego 3A, 00-645 Warszawa, Poland

Abstract

The paper presents the results concerning the influence of the thickness of the ITO and In2O3 layers deposited by the magnetron sputtering method on the physical parameters characterising their surface properties. The characterisation parameters were obtained by atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and Kelvin probe. The increase in the layers’ thickness related to the time of their fabrication causes an increase in the surface roughness and the value of the work function, followed by a decrease in the concentration of elements and compounds in the near-surface area.

Funder

Silesian University of Technology

Publisher

MDPI AG

Subject

General Materials Science

Reference31 articles.

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3