Optical Characterization of Thin Films by Surface Plasmon Resonance Spectroscopy Using an Acousto-Optic Tunable Filter

Abstract

The paper presents the application of the acousto-optic tunable filter (AOTF) in surface plasmon resonance (SPR) spectroscopy to measure the optical thickness of thin dielectric coatings. The technique presented uses combined angular and spectral interrogation modes to obtain the reflection coefficient under the condition of SPR. Surface electromagnetic waves were excited in the Kretschmann geometry, with the AOTF serving as a monochromator and polarizer of light from a white broadband radiation source. The experiments highlighted the high sensitivity of the method and the lower amount of noise in the resonance curves compared with the laser light source. This optical technique can be implemented for nondestructive testing in the production of thin films in not only the visible, but also the infrared and terahertz ranges.