Nano X-ray Tomography Application for Quantitative Surface Layer Geometry Analysis after Laser Beam Modification

Abstract

Analysis of the geometrical structure of the surface of materials is an issue already widely recognised and included in international standards. The authors present the possibilities of extending the analysis of the coatings’ geometrical structure through X-ray nanotomography imaging, three-dimensional image processing, and stereological methods. Analysis of the state of the art reveals that there are no scientific rapports (indexed by Scopus) on the application X-ray nanotomography for analysis of the geometry of a coating. The presented study shows that this imaging technique can be applied and provide additional information on the quality of the layer. The comparative tests were carried out on samples with a cermet coating before and after laser treatment, including standard tests of the surface geometry and the analysis of three-dimensional images obtained from nanotomography. A set of parameters describing the compactness and thickness distribution of the applied coating is proposed, which facilitates the qualitative assessment of the application process and improvements through the additional processing of technological layers. The obtained results show that although the average thickness values before and after laser treatment did not differ significantly, their distribution on the sample surface was different, as presented in the visualisation. The determined stereological parameter NV (number of objects per unit volume) allowed for the assessment of the layer compactness, and as the analyses showed, this value decreased by more than two times after laser treatment. The analysis of the degree of sample coverage by the cermet layer showed that it increased from 70% to 95% after laser treatment, which confirms the treatment’s positive effect on the layer’s quality. This research shows that three-dimensional analysis significantly enriches the information about the geometry of the surface layer, providing data which other research techniques are unable to acquire.