Overall Profile Measurements of Tiny Parts with Complicated Features with the Cradle-Type Five-Axis System

Author:

Liu LeiORCID,Zhu Linlin,Miao Li,Li Chen,Fang Changshuai,Zhang Xiaodong

Abstract

There are generally complex features with large curvature or narrow space on surfaces of complicated tiny parts, which makes high-precision measurements of their three-dimensional (3D) overall profiles a long-lasting industrial problem. This paper proposes a feasible measurement solution to this problem, by designing a cradle-type point-scanning five-axis measurement system. All the key technology of this system is also studied from the system construction to the actual measurement process, and the measurement accuracy is improved through error calibration and compensation. Finally, the feasibility is proved by engineering realization. The measurement capability of the system is verified by measuring workpieces such as cross cylinders and microtriangular pyramids.

Funder

Science Challenge Program

National Key Research and Development Program of China

Tianjin Natural Science Foundation of China

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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