Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch

Abstract

An X-pinch scheme of a low-current generator (45 kA, 50 ns rise time) is characterized as a potential efficient source of soft X-rays. The X-pinch target consists of wires of 5 μm in diameter—made from either tungsten (W) or gold (Au)-plated W—loaded at two angles of 55° and 98° between the crossed wires. Time-resolved soft X-ray emission measurements are performed to provide a secure correlation with the optical probing results. A reconstruction of the actual photodiode current profile procedure was adopted, capable of overcoming the limits of the slow rising and falling times due to the “slow” response of the diodes and the noise. The pure and Au-plated W deliver an average X-ray yield, which depends only on the angle of the crossed wires, and is measured to be ~50 mJ and ~70 mJ for the 98° and 55° crossed wire angles, respectively. An additional experimental setup was developed to characterize the X-pinch as a source of X-rays with energy higher than ~6 keV, via time-integrated measurements. The X-ray emission spectrum was found to have an upper limit at 13 keV for the Au-plated W configuration at 55°. The portable tabletop X-pinch proved to be ideal for use in X-ray radiography applications, such as the detection of interior defects in biological samples.