Effect of Argon Glow Plasma Pretreatment of Pure Ta on Hf Coating Preparation

Author:

Yang Kai1,Dang Bo1,Jia Xingqi2,Lu Fenghua2,Ding Feng3,Li Fengkun1,Wei Dongbo1ORCID,Zhang Pingze1

Affiliation:

1. College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China

2. Shanghai Key Laboratory of Materials Laser Processing and Modification, Shanghai Jiao Tong University, Shanghai 200240, China

3. School of Intelligent Manufacturing and Information, Jiangsu Shipping College, Nantong 226010, China

Abstract

In order to enhance the bonding strength between coatings and substrates, argon glow plasma pretreatment with various times was conducted on tantalum substrates, followed by hafnium coating deposition. The coating, consisting of deposition and a diffusion layer with nanocrystalline grains of dimensions ranging from 10 to 20 nm, obtained on the substrate pretreated for 1 h, manifested the optimal structure, with a maximum thickness of approximately 14 μm and the best adhesion performance of approximately 9.5 N. The study found that the pretreatment led to grain refinement at a depth of approximately 150 nm and an increase in the crystal face spacing of substrate and high-energy defects. In addition, the crystal defects and lightly increased surface roughness enhanced the surface energy, while the Ta (200) and Ta (211) crystal faces, which had a lower combination energy and a more stable state with Hf atoms than the Ta (110) crystal face, were considerably increased on pretreated substrates with a decrease in the Ta (110) crystal face. Consequently, coating elements exhibited enhanced diffusion within the substrate, leading to the better formation of a gradient structure, which effectively improved the adhesion of coatings. Further, this study offers an efficacious approach to enhance coating adhesion and provides a deeper understanding of plasma pretreatment.

Funder

Nantong Basic Science Research Program

Publisher

MDPI AG

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3