Chemical Solution Deposition of YBCO Films with Gd Excess

Abstract

Chemical solution deposition of Gd-doped YBCO, Y1GdyBa2Cu3O7−δ, (YBCO-Gd), film was carried out following the metal-organic decomposition approach and in situ route. Two dopant concentrations, 5 and 10 mol %, were evaluated. The morphology and crystalline structure of the superconductor films were deeply investigated. In general, a homogeneous and well c-axis oriented film was observed by using scanning and transmission electron microscopy (SEM and TEM) and X-ray diffraction. However, compared to pure YBCO, YBCO-Gd samples showed an increased stacking faults concentration, as recognized by TEM. X-ray photoelectron spectroscopy allowed studying the Gd distribution in the films and gathered information about the Gd electronic environment. Superconducting properties were evaluated at different temperatures, magnetic field directions, and intensities. Higher zero-field critical current densities were measured with respect to undoped samples in the temperature range from 10 to 77 K with both Gd concentrations (i.e., 28, 27, and 13 MA·cm−2, respectively, for YBCO-Gd 5%, YBCO-Gd 10%, and undoped YBCO at 10 K in self field condition). At low temperatures, this improvement was maintained up to 12 T, confirming the efficacy of Gd addition for the enhancement of transport properties of YBCO film.