Uncertainty of the X-ray Diffraction (XRD) sin2 ψ Technique in Measuring Residual Stresses of Physical Vapor Deposition (PVD) Hard Coatings

Author:

Luo Quanshun,Yang Shicai

Publisher

MDPI AG

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces

Reference33 articles.

1. Elements of X-ray Diffraction;Cullity,2001

2. Residual Stress—Measurement by Diffraction and Interpretation;Noyan,1987

3. Analysis of thin film stress measurement techniques

4. Measurement Good Practice Guide No. 52. Determination of Residual Stresses by X-ray Diffraction—Issue 2;Fitzpatrick,2006

5. Residual stresses and elastic modulus of thermal barrier coatings graded in porosity

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