Four-Polarisation Camera for Anisotropy Mapping at Three Orientations: Micro-Grain of Olivine

Author:

Kamegaki Shuji1ORCID,Smith Daniel2ORCID,Ryu Meguya3ORCID,Ng Soon Hock2ORCID,Huang Hsin-Hui2ORCID,Maasoumi Pegah2,Vongsvivut Jitraporn4ORCID,Moraru Daniel5ORCID,Katkus Tomas2,Juodkazis Saulius26ORCID,Morikawa Junko16

Affiliation:

1. CREST-JST and School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan

2. Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, VIC 3122, Australia

3. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Japan

4. ANSTO-Australian Synchrotron, Infrared Microspectroscopy (IRM) Beamline, 800 Blackburn Road, Clayton, VIC 3168, Australia

5. Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Hamamatsu 432-8011, Japan

6. WRH Program International Research Frontiers Initiative (IRFI) Tokyo Institute of Technology, Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan

Abstract

A four-polarisation camera was used to map the absorbance of olivine micro-grains before and after high-temperature annealing (HTA). It is shown that HTA of olivine xenoliths at above 1200 °C in O2 flow makes them magnetised. Different modes of operation of the polariscope with polarisation control before and after the sample in transmission and reflection modes were used. The reflection type was assembled for non-transparent samples of olivine after HTA. The sample for optical observation in transmission was placed on an achromatic, plastic, quarter-wavelength waveplate as a sample holder. Inspection of the sample’s birefringence (retardance), as well as absorbance, was undertaken. The best fit for the transmitted intensity or transmittance T (hence, absorbance A=−log10T) is obtainable using a simple best fit with only three orientations (from the four orientations measured by the camera). When the intensity of transmitted light at one of the orientations is very low due to a cross-polarised condition (polariser–analyser arrangement), the three-point fit can be used. The three-point fit in transmission and reflection modes was validated for T(θ)=Amp×cos(2θ−2θshift)+offset, where the amplitude Amp, offset offset, and orientation azimuth θshift were extracted for each pixel via the best fit.

Funder

ARC Linkage

JSPS KAKENHI

JST CREST

Infrared Microspectroscopy (IRM) beamline at the Australian Synchrotron

Publisher

MDPI AG

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3