Four-Polarisation Camera for Anisotropy Mapping at Three Orientations: Micro-Grain of Olivine

Author:

Kamegaki Shuji1ORCID,Smith Daniel2ORCID,Ryu Meguya3ORCID,Ng Soon Hock2ORCID,Huang Hsin-Hui2ORCID,Maasoumi Pegah2,Vongsvivut Jitraporn4ORCID,Moraru Daniel5ORCID,Katkus Tomas2,Juodkazis Saulius26ORCID,Morikawa Junko16

Affiliation:

1. CREST-JST and School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan

2. Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, VIC 3122, Australia

3. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Japan

4. ANSTO-Australian Synchrotron, Infrared Microspectroscopy (IRM) Beamline, 800 Blackburn Road, Clayton, VIC 3168, Australia

5. Research Institute of Electronics, Shizuoka University, Johoku 3-5-1, Hamamatsu 432-8011, Japan

6. WRH Program International Research Frontiers Initiative (IRFI) Tokyo Institute of Technology, Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan

Abstract

A four-polarisation camera was used to map the absorbance of olivine micro-grains before and after high-temperature annealing (HTA). It is shown that HTA of olivine xenoliths at above 1200 °C in O2 flow makes them magnetised. Different modes of operation of the polariscope with polarisation control before and after the sample in transmission and reflection modes were used. The reflection type was assembled for non-transparent samples of olivine after HTA. The sample for optical observation in transmission was placed on an achromatic, plastic, quarter-wavelength waveplate as a sample holder. Inspection of the sample’s birefringence (retardance), as well as absorbance, was undertaken. The best fit for the transmitted intensity or transmittance T (hence, absorbance A=−log10T) is obtainable using a simple best fit with only three orientations (from the four orientations measured by the camera). When the intensity of transmitted light at one of the orientations is very low due to a cross-polarised condition (polariser–analyser arrangement), the three-point fit can be used. The three-point fit in transmission and reflection modes was validated for T(θ)=Amp×cos(2θ−2θshift)+offset, where the amplitude Amp, offset offset, and orientation azimuth θshift were extracted for each pixel via the best fit.

Funder

ARC Linkage

JSPS KAKENHI

JST CREST

Infrared Microspectroscopy (IRM) beamline at the Australian Synchrotron

Publisher

MDPI AG

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces

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