Display Line Defect Detection Method Based on Color Feature Fusion

Author:

Xie Wenqiang,Chen Huaixin,Wang Zhixi,Liu Biyuan,Shuai Lingyu

Abstract

Display color line defect detection is an important step in the production quality inspection process. In order to improve the detection accuracy of low contrast line defects, we propose a display line defect detection method based on color feature fusion. The color saliency channels in the RG|GR and BY|YB channels were obtained using the relative entropy maximum criterion. Then, RG|GR were combined with the a channel and BY|YB with the b channel to calculate the red-green and the blue-yellow color fusion maps. The fusion color saliency map of the red-green and the blue-yellow color fusion maps was obtained by color feature fusion. Finally, the segmentation threshold was calculated according to the mean and standard deviation of the fusion color saliency map. The fused color saliency map was binarized and segmented to obtain a binary map of color line defects. The experimental results show that for the detection of multi-background offline defects, the detection accuracy of the algorithm in this paper is better than 90%, while other mainstreams fail to detect. Compared with state-of-the-art saliency detection algorithms, our method is capable of real-time low-contrast line defect detection.

Funder

“Yang Fan” major project

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Control and Optimization,Mechanical Engineering,Computer Science (miscellaneous),Control and Systems Engineering

Reference35 articles.

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