Ultrathin Films of Silver by Magnetron Sputtering

Author:

Filip Ana VioletaORCID,Sava Bogdan AlexandruORCID,Medianu Rares Victor,Boroica Lucica,Dinca Marius Catalin,Pascu Rovena,Tigau Nicolae,Andrei Andreea,Moldovan AntoniuORCID,Dumitru MariusORCID,Oane MihaiORCID,Eftimie MihaiORCID

Abstract

The interest in ultrathin silver (Ag) films has increased due to their high surface plasmon resonance for coatings of only a few nm. Low roughness ultrathin films of 1 to 9 nm have been deposited on different substrates, such as polyethylene terephthalate (PET) and optical glass, using radio frequency (RF) magnetron sputtering. Films show good surface plasmon resonance up to 7 nm thickness, as revealed by the ultraviolet-visible (UV-Vis) spectra. The roughness of the films, investigated by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM), is small, and one can conclude that depositions are smooth and homogeneous. The bandgap values decrease with film thickness. The refractive index of the films, calculated from ellipsometry measurements, leads to values of under 1 visible domain, with minima in the wavelength range of 400–600 nm. The results are useful for obtaining lower roughness ultrathin Ag films with good surface plasmon resonance for photonic applications.

Funder

EC

the Romanian Ministry of Research, Innovation and Digitization UEFISCDI

Core Program

Program I—Development of the National R & D System, Subprogram 1.2–Institutional Performance–Projects for Excellence Financing in RDI

the Ministry of Research, Innovation and Digitization, CCCDI-UEFISCDI

Publisher

MDPI AG

Subject

Inorganic Chemistry

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