On the Application of an In Situ Catalyst Characterization System (ICCS) and a Mass Spectrometer Detector as Powerful Techniques for the Characterization of Catalysts

Abstract

The in situ characterization of catalysts provides important information on the catalyst and the understanding of its catalytic performance and selectivity for a specific reaction. Temperature programmed analyses (TPX) techniques for catalyst characterization reveal the role of the support on the stabilization and dispersion of the active sites. However, these can be altered at high temperatures since sintering of active species can occur as well as possible carbon deposition which hinders the active species and deactivates the catalyst. The in situ characterization of the spent catalyst, however, may expose the causes of catalyst deactivation. For example, a simple temperature programmed oxidation (TPO) analysis on the spent catalyst may produce CO and CO2 via a reaction with O2 at high temperatures and this is a strong indication that deactivation may be due to the deposition of carbon. Other TPX techniques such as temperature programmed reduction (TPR) and pulse chemisorption are also valuable techniques when they are applied in situ to the fresh catalyst and then to the catalyst upon deactivation. In this work, two Ni supported catalysts were considered as examples to elucidate the importance of these techniques in the characterization study of catalysts applied to the reaction of hydrogenation of CO2.