Focus on the Avalanche Breakdown Characteristic of Si- and InP-Based APDs Irradiated by Fast Neutrons

Abstract

The Si- and InP-based APDs as the most important weak light semiconductor photodetectors to have achieved commercial success and are widely used in irradiation environments. Investigating the influencing mechanism of neutron irradiation on the above two types of APDs is of scientific and practical importance. In this paper, the dark current and gain characteristics of Si- and InP-based APDs around breakdown voltage were analyzed in detail before and after irradiation. The increase of dark current and the decrease of gain were observed for both the neutron irradiated Si- and InP-based APDs. Generation centers induced by neutrons are responsible for the increased dark current. The decrease of gain can be attributed to the increase of multiplied dark current and the change of electric field distribution in APD. The Si-based APD exhibits soft breakdown with the breakdown voltage reduced by ~8 V under the neutron fluence of 1.0 × 1012 cm−2, while the soft breakdown occurs along with a small change of breakdown voltage of ~1.5 V under the neutron fluence of 1.0 × 1013 cm−2 for InP-based APD. The difference in the change of breakdown voltage probably occurs because the Si-based APD uses p-doped Si as the multiplication layer, in which the neutron induced carrier removing effect cannot be ignored to keep the electric field distribution away from the optimal state. Therefore, using an intrinsic multiplication layer in APD is helpful to improve the neutron radiation resistance. The findings here are not only useful for the radiation hardened design of APD, but also deepen the understanding of irradiation mechanism.