Quantitative Detection of Defects in Multi-Layer Lightweight Composite Structures Using THz-TDS Based on a U-Net-BiLSTM Network

Author:

Zhang Dandan123ORCID,Li Lulu123,Zhang Jiyang123,Ren Jiaojiao123,Gu Jian123,Li Lijuan123,Jiang Baihong4,Zhang Shida123

Affiliation:

1. Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, Changchun University of Science and Technology, Changchun 130022, China

2. School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China

3. Zhongshan Institute of Changchun University of Science and Technology, Zhongshan 528400, China

4. Institute of Aerospace Special Materials and Technology, Beijing 100074, China

Abstract

Multi-layer lightweight composite structures are widely used in the field of aviation and aerospace during the processes of manufacturing and use, and, as such, they inevitably produce defects, damage, and other quality problems, creating the need for timely non-destructive testing procedures and the convenient repair or replacement of quality problems related to the material. When using terahertz non-destructive testing technology to detect defects in multi-layer lightweight composite materials, due to the complexity of their structure and defect types, there are many signal characteristics of terahertz waves propagating in the structures, and there is no obvious rule behind them, resulting in a large gap between the recognition results and the actual ones. In this study, we introduced a U-Net-BiLSTM network that combines the strengths of the U-Net and BiLSTM networks. The U-Net network extracts the spatial features of THz signals, while the BiLSTM network captures their temporal features. By optimizing the network structure and various parameters, we obtained a model tailored to THz spectroscopy data. This model was subsequently employed for the identification and quantitative analysis of defects in multi-layer lightweight composite structures using THz non-destructive testing. The proposed U-Net-BiLSTM network achieved an accuracy of 99.45% in typical defect identification, with a comprehensive F1 score of 99.43%, outperforming the CNN, ResNet, U-Net, and BiLSTM networks. By leveraging defect classification and thickness recognition, this study successfully reconstructed three-dimensional THz defect images, thereby realizing quantitative defect detection.

Funder

the Ninth Zhongshan Scientific Innovative Research Teams under Grant

the second batch of social public welfare and basic research projects in Zhongshan City

Jilin Provincial Science and Technology Development Plan Project

Publisher

MDPI AG

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