A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits

Author:

Mazumder Dipayan1ORCID,Datta Mithun1,Bodoh Alexander C.1ORCID,Sakib Ashiq A.1ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Florida Polytechnic University, Lakeland, FL 33805, USA

Abstract

The increasing demand for high-speed, energy-efficient, and miniaturized electronics has led to significant challenges and compromises in the domain of conventional clock-based digital designs, most notably reduced circuit reliability, particularly in mission-critical hardware. At scaled technology nodes, devices are vulnerable to transient or soft errors, such as Single Event Upset (SEU) and Single Event Latch-up (SEL). External radiation, internal electromagnetic interference (EMI), or noise are the primary sources of these errors, which can compromise the circuit functionality. In response to these challenges, the Quasi-Delay-Insensitive (QDI) Null Convention Logic (NCL) asynchronous design paradigm has emerged as a promising alternative, offering advantages such as ultra-low power performance, reduced noise and EMI, and resilience to process, voltage, and temperature variations. Moreover, its unique architecture and insensitivity to timing variations offers a degree of resistance against transient errors; however, it is not entirely resilient. Several resiliency schemes are available to detect and mitigate soft errors in QDI circuits, with approaches based on redundancy proving to be the most effective in ensuring complete resilience across all major QDI implementation paradigms, including NCL, Pre-charge/Weak-charge Half Buffers (PCHB/WCHB), and Sleep Convention Logic (SCL). This research focuses on one such redundancy-based resiliency scheme for QDI NCL circuits, known as the dual-modular redundancy-based NCL (DMR-NCL) architecture, and addresses the absence of formal methods for the verification and analysis of such circuits. A novel methodology has been proposed for formally verifying the correctness of DMR-NCL circuits synthesized from their synchronous counterparts, covering both safety (functional correctness) and liveness (the absence of deadlock). In addition, this research introduces a formal framework for the vulnerability analysis of DMR-NCL circuits against SEU/SEL. To demonstrate the framework’s efficacy and scalability, a prototype computer-aided support tool has been developed, which verifies and analyzes multiple DMR-NCL benchmark circuits of varying sizes and complexities.

Funder

National Science Foundation

Woodrow W. Everett, Jr. SCEEE Development Fund

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering

Reference40 articles.

1. Di, J., and Smith, S.C. (2019). Asynchronous Circuit Applications, IET. Available online: https://digital-library.theiet.org/content/books/cs/pbcs061e.

2. Basic mechanisms and modeling of single-event upset in digital microelectronics;Dodd;IEEE Trans. Nucl. Sci.,2003

3. Theory of single event latchup in complementary metal oxide semiconductor circuits;Shoga;IEEE Trans. Nucl. Sci.,1986

4. Sakib, A.A. (2021, January 23–27). Soft error tolerant quasi-delay insensitive asynchronous circuits: Advancements and challenges. Proceedings of the 34th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI), Campinas, Brazil.

5. Fant, K.M., and Brandt, S.A. (1996, January 19–21). Null convention logic: A complete and consistent logic for asynchronous digital circuit synthesis. Proceedings of the International Conference on Application Specific Systems, Architectures and Processors: ASAP’96, Chicago, IL, USA.

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