1. Laboratory for Emerging Nanometrology (LENA), Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, 38106 Braunschweig, Germany
2. Research Center for Photonics—National Research and Innovation Agency (BRIN), South Tangerang 15314, Indonesia
3. Department of Metrology, Kenya Bureau of Standards (KEBS), Nairobi 00200, Kenya