Real-Time Elemental Analysis Using a Handheld XRF Spectrometer in Scanning Mode in the Field of Cultural Heritage

Author:

Asvestas Anastasios1,Chatzipanteliadis Demosthenis1,Gerodimos Theofanis1ORCID,Mastrotheodoros Georgios P.12ORCID,Tzima Anastasia1,Anagnostopoulos Dimitrios F.1ORCID

Affiliation:

1. Department of Materials Science and Engineering, University of Ioannina, 45110 Ioannina, Greece

2. Department of Conservation of Antiquities and Works of Art, University of West Attica, 12243 Athens, Greece

Abstract

An X-ray fluorescence handheld spectrometer (hh-XRF) is adapted for real-time qualitative and quantitative elemental analysis in scanning mode for applications in cultural heritage. Specifically, the Tracer-5i (Bruker) is coupled with a low-cost constructed computer-controlled x–y target stage that enables the remote control of the target’s movement under the ionizing X-ray beam. Open-source software synchronizes the spectrometer’s measuring functions and handles data acquisition and data analysis. The spectrometer’s analytical capabilities, such as sensitivity, energy resolution, beam spot size, and characteristic transition intensity as a function of the distance between the spectrometer and the target, are evaluated. The XRF scanner’s potential in real-time imaging, object classification, and quantitative analysis in cultural heritage-related applications is explored and the imaging capabilities are tested by scanning a 19th-century religious icon. The elemental maps provide information on used pigments and reveal an underlying icon. The scanner’s capability to classify metallic objects was verified by analyzing the measured raw spectra of a coin collection using Principal Components Analysis. Finally, the handheld’s capability to perform quantitative analysis in scanning mode is demonstrated in the case of precious metals, applying a pre-installed quantification routine.

Publisher

MDPI AG

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