Knowledge Embedding Relation Network for Small Data Defect Detection

Abstract

In industrial vision, the lack of defect samples is one of the key constraints of depth vision quality inspection. This paper mainly studies defect detection under a small training set, trying to reduce the dependence of the model on defect samples by using normal samples. Therefore, we propose a Knowledge-Embedding Relational Network. We propose a Knowledge-Embedding Relational Network (KRN): firstly, unsupervised clustering and convolution features are used to model the knowledge of normal samples; at the same time, based on CNN feature extraction assisted by image segmentation, the conv feature is obtained from the backbone network; then, we build the relationship between knowledge and prediction samples through covariance, embed the knowledge, further mine the correlation using gram operation, normalize the power of the high-order features obtained by covariance, and finally send them to the prediction network. Our KRN has three attractive characteristics: (I) Knowledge Modeling uses the unsupervised clustering algorithm to statistically model the standard samples so as to reduce the dependence of the model on defect data. (II) Covariance-based Knowledge Embedding and the Gram Operation capture the second-order statistics of knowledge features and predicted image features to deeply mine the robust correlation. (III) Power Normalizing suppresses the burstiness of covariance module learning and the complexity of the feature space. KRN outperformed several advanced baselines in small training sets on the DAGM 2007, KSDD, and Steel datasets.