Abstract
This paper characterizes the surface modification on silicon surfaces with different patterns (circle, pyramid) using a nanosecond fiber laser with different parameters, which enhances its anti-reflection property. The influence of textured and untextured silicon surfaces and their structural properties were evaluated. It has a long absorption path (200–1000 nm) and a rougher surface due to surface modifications, which results in a 40% decrease in incident light reflectance, especially in pyramid-shaped dimples with 70 µm size, helping to trap more light in solar cells where the anti-reflecting surface is a crucial need for devices used in optical and photovoltaic applications to operate more effectively. Scanning electron microscope (SEM) and atomic force microscopy (AFM) are used to examine the surface features to determine the process’s effectiveness and recognize the development of patterns that are deep enough to trap light. XRD and micro-Raman spectroscopy were used to examine the irradiated surface’s crystallographic structure and crystallinity change.
Subject
Surfaces, Coatings and Films,Mechanical Engineering
Reference24 articles.
1. Roughness measurement using optical profiler with self-reference laser and stylus instrument—A comparative study;Chand;Indian J. Pure Appl. Phys.,2011
2. Radfar, B., Es, F., Nasser, H., Akdemir, O., Bek, A., and Turan, R. (2018, January 19–21). Effect of Laser Parameters and Post-Texturing Treatments on the Optical and Electrical Properties of Laser Textured c-Si Wafers. Proceedings of the 8th International Conference on Crystalline Silicon Photovoltaics, Lausanne, Switzerland.
3. Review on different front surface modification of both n+-p-p+ and p+-n-n+ C- Si solar cell;Dasgupta;Mater. Today Proc.,2017
4. Micron-scale modifications of Si surface morphology by pulsed-laser texturing;Cahill;Phys. Rev. B,2001
5. Lee, B.G., Lin, Y.-T., Sher, M.-J., Mazur, E., and Branz, H.M. (2012, January 3–8). Light Trapping for Thin Silicon Solar Cells by Femtosecond Laser Texturing. Proceedings of the 38th IEEE Photovoltaic Specialists Conference, Austin, TA, USA.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献