An Experimental Study on the Defect Detectability of Time- and Frequency-Domain Analyses for Flash Thermography

Author:

Poelman GaétanORCID,Hedayatrasa SaeidORCID,Segers JoostORCID,Van Paepegem Wim,Kersemans MathiasORCID

Abstract

A defect’s detectability in flash thermography is highly dependent on the applied post-processing methodology. The majority of the existing analysis techniques operate either on the time-temperature data or on the frequency-phase data. In this paper, we compare the efficiency of time- and frequency-domain analysis techniques in flash thermography for obtaining good defect detectability. Both single-bin and integrated-bin evaluation procedures are considered: dynamic thermal tomography and thermal signal area for the time-domain approach, and frequency domain tomography and adaptive spectral band integration for the frequency-domain approach. The techniques are applied on various carbon fiber reinforced polymer samples having a range of defect sizes and defect types. The advantages and drawbacks of the different post-processing techniques are evaluated and discussed. The best defect detectability is achieved using the integrated procedure in frequency domain.

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3