A Parametric EIT System Spice Simulation with Phantom Equivalent Circuits

Abstract

In this paper a number of LT Spice simulations have been carried out on an Electrical Impedance Tomography (EIT) system, which includes the whole analog and digital circuitry as well as the subject to be examined (phantom model). The aim of this study is to show how the analog and digital parts, the electrodes and the subject’s physical properties may impact the measurements and the quality of the reconstructed image. This could provide a useful tool for designing an EIT system. Special attention has been given to the current source’s output impedance and swing, to the noise produced by the circuits and to the Analog to Digital Converters (ADCs) resolution and sampling rate. Furthermore, some 3D phantom subjects have been modeled and simulated as equivalent circuits, merged with the EIT simulated hardware, in order to observe how changes on their properties interact with the whole circuitry and affect the final result. Observations show that mirrored current sources with z o u t > 350 k Ω and sufficiently high ADC acquisition sampling rate ( f s a m p l e ≥ 16 f i n ) can result to accurate impedance measurements and therefore quality image reconstruction within a frequency span of at least 10 to 100 kHz. Moreover, possible hardware failures (electrode disconnections and imbalanced contact impedances) can be detected with a simple examination of the first extracted image and measurement set, so that by direct modification of the reconstruction process, a corrected result can be obtained.