Vision-Based Detection and Classification of Used Electronic Parts

Author:

Chand PraneelORCID,Lal Sunil

Abstract

Economic and environmental sustainability is becoming increasingly important in today’s world. Electronic waste (e-waste) is on the rise and options to reuse parts should be explored. Hence, this paper presents the development of vision-based methods for the detection and classification of used electronics parts. In particular, the problem of classifying commonly used and relatively expensive electronic project parts such as capacitors, potentiometers, and voltage regulator ICs is investigated. A multiple object workspace scenario with an overhead camera is investigated. A customized object detection algorithm determines regions of interest and extracts data for classification. Three classification methods are explored: (a) shallow neural networks (SNNs), (b) support vector machines (SVMs), and (c) deep learning with convolutional neural networks (CNNs). All three methods utilize 30 × 30-pixel grayscale image inputs. Shallow neural networks achieved the lowest overall accuracy of 85.6%. The SVM implementation produced its best results using a cubic kernel and principal component analysis (PCA) with 20 features. An overall accuracy of 95.2% was achieved with this setting. The deep learning CNN model has three convolution layers, two pooling layers, one fully connected layer, softmax, and a classification layer. The convolution layer filter size was set to four and adjusting the number of filters produced little variation in accuracy. An overall accuracy of 98.1% was achieved with the CNN model.

Funder

Waikato Institute of Technology Contestable Fund

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference40 articles.

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