Elimination of Leaf Angle Impacts on Plant Reflectance Spectra Using Fusion of Hyperspectral Images and 3D Point Clouds

Author:

Zhang Libo,Jin Jian,Wang Liangju,Rehman Tanzeel U.,Gee Mark T.

Abstract

During recent years, hyperspectral imaging technologies have been widely applied in agriculture to evaluate complex plant physiological traits such as leaf moisture content, nutrient level, and disease stress. A critical component of this technique is white referencing used to remove the effect of non-uniform lighting intensity in different wavelengths on raw hyperspectral images. However, a flat white tile cannot accurately reflect the lighting intensity variance on plant leaves, since the leaf geometry (e.g., tilt angles) and its interaction with the illumination severely impact plant reflectance spectra and vegetation indices such as the normalized difference vegetation index (NDVI). In this research, the impacts of leaf angles on plant reflectance spectra were summarized, and an improved image calibration model using the fusion of leaf hyperspectral images and 3D point clouds was built. Corn and soybean leaf samples were imaged at different tilt angles and orientations using an indoor desktop hyperspectral imaging system and analyzed for differences in the NDVI values. The results showed that the leaf’s NDVI largely changed with angles. The changing trends with angles differed between the two species. Using measurements of leaf tilt angle and orientation obtained from the 3D point cloud data taken simultaneously with the hyperspectral images, a support vector regression (SVR) model was successfully developed to calibrate the NDVI values of pixels at different angles on a leaf to a same standard as if the leaf was laid flat on a horizontal surface. The R-squared values between the measured and predicted leaf angle impacts were 0.76 and 0.94 for corn and soybean, respectively. This method has a potential to be used in any general plant imaging systems to improve the phenotyping quality.

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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