Quantitative Deviation of Nanocrystals Using the RIR Method in X-ray Diffraction (XRD)

Author:

Huang Qinyuan,Wang ChunjianORCID,Shan QuanORCID

Abstract

The reference intensity ratio (RIR) method, using X-ray diffraction (XRD), is considered one most of the rapid and convenient approaches for phase quantification in multi-phase mixture, in which nanocrystals are commonly contained in a mixture and cause a broadening of the diffraction peak, while another broadening factor, instrumental broadening, does not attract enough attention in related quantitative analysis. Despite the specimen consisting of 50 wt.% TiO2 nanomaterials (nano-TiO2) and 50 wt.% microscale ZnO powder, the nano-TiO2 quantitative result changes from 56.53% to 43.33% that occur as a variation of instrumental broadening are caused by divergence slit adjustment. This deviation could be accounted through a mathematical model that involves instrumental broadening. The research in this paper might provide a useful guide for developing an approach to measure accuracy quantification in unknown multi-phase mixtures

Funder

the Science Research Foundation of Yunnan Education Bureau

Publisher

MDPI AG

Subject

General Materials Science,General Chemical Engineering

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3