Affiliation:
1. Graduate School of Artificial Intelligence, Jeonju University, Jeonju-si 55069, Republic of Korea
2. Artificial Intelligence Research Center, Jeonju University, Jeonju-si 55069, Republic of Korea
Abstract
Image dehazing, a fundamental problem in computer vision, involves the recovery of clear visual cues from images marred by haze. Over recent years, deploying deep learning paradigms has spurred significant strides in image dehazing tasks. However, many dehazing networks aim to enhance performance by adopting intricate network architectures, complicating training, inference, and deployment procedures. This study proposes an end-to-end U-Net dehazing network model with recursive gated convolution and attention mechanisms to improve performance while maintaining a lean network structure. In our approach, we leverage an improved recursive gated convolution mechanism to substitute the original U-Net’s convolution blocks with residual blocks and apply the SK fusion module to revamp the skip connection method. We designate this novel U-Net variant as the Dehaze Recursive Gated U-Net (DRGNet). Comprehensive testing across public datasets demonstrates the DRGNet’s superior performance in dehazing quality, detail retrieval, and objective evaluation metrics. Ablation studies further confirm the effectiveness of the key design elements.
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Vision and Pattern Recognition,Radiology, Nuclear Medicine and imaging
Reference57 articles.
1. McCartney, E.J. (1976). Optics of the Atmosphere: Scattering by Molecules and Particles, John Wiley and Sons.
2. Vision in Bad Weather;Nayar;Proceedings of the 7th IEEE International Conference on Computer Vision,1999
3. Vision and the Atmosphere;Narasimhan;Int. J. Comput. Vis.,2002
4. Long, J., Shelhamer, E., and Darrell, T. (2015, January 7–12). Fully Convolutional Networks for Semantic Segmentation. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Boston, MA, USA.
5. He, K., Zhang, X., Ren, S., and Sun, J. (2016, January 27–30). Deep Residual Learning for Image Recognition. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Las Vegas, NV, USA.
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