Target Design in SEM-Based Nano-CT and Its Influence on X-ray Imaging

Author:

Fell Jonas1ORCID,Wetzler Felix1,Maisl Michael2,Herrmann Hans-Georg12ORCID

Affiliation:

1. Lightweight Systems, Department of Materials Science, Campus E3 1, Saarland University, 66123 Saarbrücken, Germany

2. Fraunhofer Institute for Nondestructive Testing IZFP, Campus E3 1, 66123 Saarbrücken, Germany

Abstract

Nano-computed tomography (nano-CT) based on scanning electron microscopy (SEM) is utilized for multimodal material characterization in one instrument. Since SEM-based CT uses geometrical magnification, X-ray targets can be adapted without any further changes to the system. This allows for designing targets with varying geometry and chemical composition to influence the X-ray focal spot, intensity and energy distribution with the aim to enhance the image quality. In this paper, three different target geometries with a varying volume are presented: bulk, foil and needle target. Based on the analyzed electron beam properties and X-ray beam path, the influence of the different target designs on X-ray imaging is investigated. With the obtained information, three targets for different applications are recommended. A platinum (Pt) bulk target tilted by 25° as an optimal combination of high photon flux and spatial resolution is used for fast CT scans and the investigation of high-absorbing or large sample volumes. To image low-absorbing materials, e.g., polymers or organic materials, a target material with a characteristic line energy right above the detector energy threshold is recommended. In the case of the observed system, we used a 30° tilted chromium (Cr) target, leading to a higher image contrast. To reach a maximum spatial resolution of about 100 nm, we recommend a tungsten (W) needle target with a tip diameter of about 100 nm.

Funder

German Research Council

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Vision and Pattern Recognition,Radiology, Nuclear Medicine and imaging

Reference21 articles.

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2. Combining X-ray Nano Tomography with focused ion beam serial section imaging—Application of correlative tomography to integrated circuits;Lutter;Nucl. Instrum. Methods Phys. Res. Sect. B Beam Interact. Mater. At.,2021

3. Engstler, M., Fell, J., Lutter, F., Maisl, M., Herrmann, H.G., and Mücklich, F. (2020, January 4–7). Correlative Tomography–Combining X-ray Nanotomography and FIB/SEM Serial Sectioning to analyze Al-Si cast alloys. Proceedings of the 10th International Conference on Industrial Computed Tomography, Wels, Austria.

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