A Reaction Microscope for AMO Science at Shanghai Soft X-ray Free-Electron Laser Facility

Abstract

We report on the design and capabilities of a reaction microscope (REMI) end-station at the Shanghai Soft X-ray Free-Electron Laser Facility (SXFEL). This apparatus allows high-resolution and 4π solid-angle coincidence detection of ions and electrons. The components of REMI, including a supersonic gas injection system, spectrometer, detectors and data acquisition system, are described in detail. By measuring the time of flight and the impact positions of ions and electrons on the corresponding detectors, three-dimensional momentum vectors can be reconstructed to study specific reaction processes. Momentum resolutions of ions and electrons with 0.11 a.u. are achieved, which have been measured from a single ionization experiment of oxygen molecules in an infrared (IR), femtosecond laser field, under vacuum at 1.2×10−10 torr, in a reaction chamber. As a demonstration, a Coulomb explosion experiment of oxygen molecules in the IR field is presented. These results demonstrate the performance of this setup, which provides a basic tool for the study of atomic and molecular reactions at SXFEL.