Approximation Algorithm for X-ray Imaging Optimization of High-Absorption Ratio Materials

Abstract

In the application of X-ray industrial flaw detection, the exposure parameters directly affect the image quality. The voltage of the tube is the most important factor, which is difficult to be accurately calculated. Especially in the detection of a workpiece composed of both high absorption coefficient and low absorption coefficient materials, the improper symmetric balance of the tube voltage would lead to an overexposure or underexposure phenomenon. In this paper, based on the X-ray absorption model, combined with the performance of the X-ray imaging detector, and taking the optimal symmetry and contrast as the model constraint condition, the key factors of high absorption ratio material imaging are decomposed. Through expansion and iteration, the calculation process is simplified, the optimal imaging convergence surface is found, and then the optimal energy input conditions of high absorptivity materials are obtained and symmetrically balanced. As a result, this paper solves the problem of fast selection and symmetric factor chosen of the optimal tube voltage when imaging materials with high absorption ratios. It reduces the subsequent complications of the X-ray image enhancement process and obtains a better image quality. Through experimental simulation and measurement verification, the error between the theoretical calculation results and the measured data was better than 5%.