A Proposition to Correct Infrared Emissivity Measurements for Curved Surface Targets Based on the Irradiation Reflection Method

Abstract

In this paper, a measurement correction method is proposed to correct the error of the irradiation reflection method when measuring the emissivity of curved surface targets. First, by introducing an angle parameter related to the target surface shape, the formulas of emissivity measurements for curved surface targets under various types of radiation sources were obtained. Then, the variation law of these emissivity measurement formulas was analyzed, the concept of the measurement correction factor was proposed, and then a unified correction measurement formula was obtained. Finally, a scene of measuring the emissivity of a curved surface target based on the irradiation reflection method was simulated. Different target emissivities and different distances between the radiation source and target were set, and the errors between the measured and corrected emissivities were compared. The results revealed that the proposed method could effectively correct the error caused by the curvature of the target surface when measuring its emissivity by the irradiation reflection method. This is of great significance to expanding the application scope of the irradiation reflection method and improving the measurement accuracy.