Quantum Dot Lasers Directly Grown on 300 mm Si Wafers: Planar and In-Pocket

Author:

Feng Kaiyin1ORCID,Shang Chen2,Hughes Eamonn2,Clark Andrew3,Koscica Rosalyn2ORCID,Ludewig Peter4ORCID,Harame David5,Bowers John12ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, CA 93106, USA

2. Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA

3. IQE, Inc., Greensboro, NC 27409, USA

4. NAsPIII–V GmbH, 35032 Marburg, Germany

5. RF SUNY Polytechnic Institute, Albany, NY 12203, USA

Abstract

We report for the first time the direct growth of quantum dot (QD) lasers with electrical pumping on 300 mm Si wafers on both a planar template and in-pocket template for in-plane photonic integration. O-band lasers with five QD layers were grown with molecular beam epitaxy (MBE) in a 300 mm reactor and then fabricated into standard Fabry–Perot ridge waveguide cavities. Edge-emitting lasers are demonstrated with high yield and reliable results ready for commercialization and scaled production, and efforts to make monolithically integrated lasing cavities grown on silicon-on-insulator (SOI) wafers vertically aligned and coupled to SiN waveguides on the same chip show the potential for 300 mm-scale Si photonic integration with in-pocket direct MBE growth.

Funder

DARPA MTO LUMOS program

Air Force Research Laboratory

Publisher

MDPI AG

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Atomic and Molecular Physics, and Optics

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