Terahertz Radiation from High Electron Mobility Avalanche Transit Time Sources Prospective for Biomedical Spectroscopy

Author:

Khan Sahanowaj1,Acharyya Aritra2ORCID,Inokawa Hiroshi3ORCID,Satoh Hiroaki3ORCID,Biswas Arindam4ORCID,Dhar Rudra Sankar1ORCID,Banerjee Amit5ORCID,Seteikin Alexey Y.67ORCID

Affiliation:

1. Department of Electronics & Communication Engineering, National Institute of Technology Mizoram, Chaltlang, Aizawl 796012, Mizoram, India

2. Department of Electronics and Communication Engineering, Cooch Behar Government Engineering College, Harinchawra, Ghughumari, Cooch Behar 736170, West Bengal, India

3. Research Institute of Electronics, Shizuoka University, Hamamatsu 4328011, Japan

4. Centre for IoT and AI Integration with Education-Industry-Agriculture, Department of Mining Engineering, Kazi Nazrul University, Asansol 713340, West Bengal, India

5. Microsystem Design-Integration Lab, Physics Department, Bidhan Chandra College, Asansol 713303, West Bengal, India

6. Immanuel Kant Baltic Federal University, 236000 Kaliningrad, Russia

7. Amur State University, 675027 Blagoveshchensk, Russia

Abstract

A Schottky barrier high-electron-mobility avalanche transit time (HEM-ATT) structure is proposed for terahertz (THz) wave generation. The structure is laterally oriented and based on AlGaN/GaN two-dimensional electron gas (2-DEG). Trenches are introduced at different positions of the top AlGaN barrier layer for realizing different sheet carrier density profiles at the 2-DEG channel; the resulting devices are equivalent to high–low, low–high and low-high–low quasi-Read structures. The DC, large-signal and noise simulations of the HEM-ATTs were carried out using the Silvaco ATLAS platform, non-sinusoidal-voltage-excited large-signal and double-iterative field-maximum small-signal simulation models, respectively. The breakdown voltages of the devices estimated via simulation were validated by using experimental measurements; they were found to be around 17–18 V. Under large-signal conditions, the series resistance of the device is estimated to be around 20 Ω. The large-signal simulation shows that the HEM-ATT source is capable of delivering nearly 300 mW of continuous-wave peak power with 11% conversion efficiency at 1.0 THz, which is a significant improvement over the achievable THz power output and efficiency from the conventional vertical GaN double-drift region (DDR) IMPATT THz source. The noise performance of the THz source was found to be significantly improved by using the quasi-Read HEM-ATT structures compared to the conventional vertical Schottky barrier IMPATT structure. These devices are compatible with the state-of-the-art medium-scale semiconductor device fabrication processes, with scope for further miniaturization, and may have significant potential for application in compact biomedical spectroscopy systems as THz solid-state sources.

Funder

Japan–India Science Cooperative Program

Research Centre for Biomedical Engineering, Japan in association with RIE, Shizouka University

Device Development Programme

Department of Science Technology, Ministry of Science and Technology, Government of India

Publisher

MDPI AG

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Atomic and Molecular Physics, and Optics

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