Characterization and On-Field Performance of the MuTe Silicon Photomultipliers

Author:

Peña-Rodríguez Jesús1ORCID,Sánchez-Villafrades Juan2,Asorey Hernán34,Núñez Luis A.15ORCID

Affiliation:

1. Escuela de Física, Universidad Industrial de Santander, Bucaramanga 680002, Colombia

2. Escuela de Ingeniería Eléctrica, Electrónica y de Telecomunicaciones, Universidad Industrial de Santander, Bucaramanga 680002, Colombia

3. Departamento Física Médica, Centro Atómico Bariloche, Comisión Nacional de Energía Atómica, Bariloche R8402AGP, Argentina

4. Instituto de Tecnologías en Detección y Astropartículas, Buenos Aires CP B1650KNA, Argentina

5. Departamento de Física, Universidad de loa Andes, Mérida 5101, Venezuela

Abstract

The Muon Telescope, MuTe, is an instrument for imaging volcanoes in Colombia. It consists of a scintillator tracking system and a water Cherenkov detector for particle energy measurement. The Muon Telescope operates autonomously in high-altitude environments where the temperature gradient reaches up to 10 °C. In this work, we characterize the telescope silicon photomultipliers’ breakdown voltage, gain, and noise for temperature variations spanning 0 to 40 °C. We demonstrate that the discrimination threshold for the Muon Telescope hodoscope must be above 5 photo-electrons to avoid contamination due to dark count, crosstalk, and afterpulsing. We also assess the detector counting rate depending on day-night temperature variations.

Funder

Departamento Administrativo de Ciencia, Tecnología e Innovación of Colombia

Programa de Cooperación Nivel II (PCB-II) MINCYT-CONICET-COLCIENCIAS 2015

Publisher

MDPI AG

Subject

Instrumentation

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3