Addressing Current Challenges in OSL Dosimetry Using MgB4O7:Ce,Li: State of the Art, Limitations and Avenues of Research

Author:

Bossin Lily1ORCID,Plokhikh Igor12ORCID,Christensen Jeppe Brage1ORCID,Gawryluk Dariusz Jakub2ORCID,Kitagawa Yuuki3ORCID,Leblans Paul4ORCID,Tanabe Setsuhisa5ORCID,Vandenbroucke Dirk4,Yukihara Eduardo Gardenali1ORCID

Affiliation:

1. Department of Radiation Safety and Security, Paul Scherrer Institute, Forschungsstrasse 111, 5232 Villigen, Switzerland

2. Laboratory for Multiscale Materials Experiments, Paul Scherrer Institute, Forschungsstrasse 111, 5232 Villigen, Switzerland

3. National Institute of Advanced Industrial Science and Technology (AIST), Ikeda, Osaka 563-8577, Japan

4. Radiology Division, Agfa NV, 2640 Mortsel, Belgium

5. Graduate School of Human and Environmental Studies, Kyoto University, Kyoto 606-8501, Japan

Abstract

The objective of this work is to review and assess the potential of MgB4O7:Ce,Li to fill in the gaps where the need for a new material for optically stimulated luminescence (OSL) dosimetry has been identified. We offer a critical assessment of the operational properties of MgB4O7:Ce,Li for OSL dosimetry, as reviewed in the literature and complemented by measurements of thermoluminescence spectroscopy, sensitivity, thermal stability, lifetime of the luminescence emission, dose response at high doses (>1000 Gy), fading and bleachability. Overall, compared with Al2O3:C, for example, MgB4O7:Ce,Li shows a comparable OSL signal intensity following exposure to ionizing radiation, a higher saturation limit (ca 7000 Gy) and a shorter luminescence lifetime (31.5 ns). MgB4O7:Ce,Li is, however, not yet an optimum material for OSL dosimetry, as it exhibits anomalous fading and shallow traps. Further optimization is therefore needed, and possible avenues of investigation encompass gaining a better understanding of the roles of the synthesis route and dopants and of the nature of defects.

Funder

Paul Scherrer Institute research

Swiss National Science Foundation

Publisher

MDPI AG

Subject

General Materials Science

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