Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr

Author:

Berkmans François123ORCID,Lemesle Julie45ORCID,Guibert Robin1ORCID,Wieczorowski Michał2ORCID,Brown Christopher6ORCID,Bigerelle Maxence1

Affiliation:

1. CNRS, UMR 8201-LAMIH-Laboratoire d’Automatique de Mécanique et d’Informatique Industrielles et Humaines, University Polytechnique Hauts-de-France, F-59313 Valenciennes, France

2. Institute of Mechanical Technology, Poznan University of Technology, Plac Marii Sklodowskiej-Curie 5, 60-965 Poznan, Poland

3. LARSH—Laboratoire de Recherche Societes & Humanites, INSA Hauts-de-France, University Polytechnique Hauts-de-France, F-59313 Valenciennes, France

4. VALUTEC, University Polytechnique Hauts-de-France, CEDEX 9, F-59314 Valenciennes, France

5. U.R Concept, 59300 Valenciennes, France

6. Surface Metrology Laboratory, Worcester Polytechnic Institute, Worcester, MA 01609, USA

Abstract

Various methods exist for multiscale characterization of surface topographies, each offering unique insights and applications. The study focuses on fractal-based approaches, distinguishing themselves by leveraging fractals to analyze surface complexity. Specifically, the Richardson Patchwork method, used in the ASME B46.1 and ISO 25178 standards, is compared to the Sdr parameter derived from ISO 25178-2, with a low-pass Gaussian filter for multiscale characterization. The comparison is performed from the relative area calculated on topographies of TA6V samples grit blasted with different pressures and blasting materials (media). The surfaces obtained by grit blasting have fractal-like characteristics over the scales studied, enabling the analysis of area development at multiple levels based on pressure and media. The relative area is similar for both methods, regardless of the complexity of the topographies. The relevance scale for each calculation method that significantly represents the effect of grit blasting pressure on the increased value of the relative area is a tiling of 7657.64 µm² of triangle area for the Patchwork method and a 124.6 µm cut-off for the low-pass Gaussian filter of the Sdr method. These results could facilitate a standard, friendly, new fractal method for multiscale characterization of the relative area.

Publisher

MDPI AG

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