Phase Unwrapping Error Correction Based on Multiple Linear Regression Analysis

Author:

Lv Zhuang1,Zhu Kaifeng12,He Xin1,Zhang Lei1,He Jiawei1,Mu Zhiya1,Wang Jun1,Zhang Xin1,Hao Ruidong12

Affiliation:

1. Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

2. University of Chinese Academy of Sciences, Beijing 100049, China

Abstract

Fringe projection profilometry (FPP) is prone to phase unwrapping error (PUE) due to phase noise and measurement conditions. Most of the existing PUE-correction methods detect and correct PUE on a pixel-by-pixel or partitioned block basis and do not make full use of the correlation of all information in the unwrapped phase map. In this study, a new method for detecting and correcting PUE is proposed. First, according to the low rank of the unwrapped phase map, multiple linear regression analysis is used to obtain the regression plane of the unwrapped phase, and thick PUE positions are marked on the basis of the tolerance set according to the regression plane. Then, an improved median filter is used to mark random PUE positions and finally correct marked PUE. Experimental results show that the proposed method is effective and robust. In addition, this method is progressive in the treatment of highly abrupt or discontinuous regions.

Funder

Opening Project of Key Laboratory of Sichuan Universities of Criminal Examination

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3