Abstract
Nowadays, the use of several methods for the measurement of space charges in dielectrics has become more relevant. The availability of different space charge measurement methods brings the necessity of calibration and characterization of measurement equipment to reach standardized measurements. In this paper, a method is presented to apply known charges at built samples which can be used for acoustic and thermal methods to compare measured values with calibration purposes. Experimental tests for validation purposes were performed in flat samples by comparison of results between a single layer and multilayer samples. Moreover, this method can be used to measure the resolution and accuracy of space charge measurement systems.
Funder
Consejo Nacional de Ciencia y Tecnología
Subject
Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
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