Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography-Reference-Cited by-同舟云学术

Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography

Published:2018-06-26 Issue:7 Volume:8 Page:1042
ISSN:2076-3417
Container-title:Applied Sciences
language:en
Short-container-title:Applied Sciences

Author:

Seyler Tobias^ORCID,Fratz Markus,Beckmann Tobias,Schiller Annelie,Bertz Alexander,Carl Daniel

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Link

http://www.mdpi.com/2076-3417/8/7/1042/pdf

Reference41 articles.

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5. Laser metrology — a diagnostic tool in automotive development processes

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