Temperature Compensation Method for Raster Projectors Used in 3D Structured Light Scanners

Abstract

Raster projectors are commonly used in many various measurement applications where active lighting is required, such as in three-dimensional structured light scanners. The effect of temperature on the raster projector, in some conditions, can lead to significant deterioration of the measurements performed with such a scanner. In this paper, the outcomes of several experiments concerning the effects of temperature on raster projectors are presented. The described research is focused on the thermal deformations of projected images caused by common thermal effects observed in projectors: those caused by the warming-up process and changes in ambient environmental temperature. A software compensation method is also presented. It is suitable for implementation in any existing measurement method that uses raster projectors. The results of performed verification experiments show that the developed compensation method can decrease the thermal drift of the projected images by up to 14 times in the ambient temperature range 14–42 °C.