Characterization and Electronic Properties of Heptazine Layers: Towards Promising Interfacial Materials for Organic Optoelectronics

Abstract

For the first time, an original compound belonging to the heptazine family has been deposited in the form of thin layers, both by thermal evaporation under vacuum and spin-coating techniques. In both cases, smooth and homogeneous layers have been obtained, and their properties evaluated for eventual applications in the field of organic electronics. The layers have been fully characterized by several concordant techniques, namely UV-visible spectroscopy, steady-state and transient fluorescence in the solid-state, as well as topographic and conductive atomic force microscopy (AFM) used in Kelvin probe force mode (KPFM). Consequently, the afferent energy levels, including Fermi level, have been determined, and show that these new heptazines are promising materials for tailoring the electronic properties of interfaces associated with printed electronic devices. A test experiment showing an improved electron transfer rate from a tris-(8-hydroxyquinoline) aluminum (Alq3) photo-active layer in presence of a heptazine interlayer is finally presented.