Optical Frequency Domain Reflectometry Based on Multilayer Perceptron

Author:

Yin Guolu12,Zhu Zhaohao3,Liu Min3,Wang Yu1,Liu Kaijun1,Yu Kuanglu45,Zhu Tao12

Affiliation:

1. Key Laboratory of Optoelectronic Technology & Systems (Ministry of Education), Chongqing University, Chongqing 400044, China

2. State Key Laboratory of Coal Mine Disaster Dynamics and Control, Chongqing University, Chongqing 400044, China

3. School of Microelectronics & Communication Engineering, Chongqing University, Chongqing 400044, China

4. Institute of Information Science, School of Computer and Information Technology, Beijing Jiaotong University, Beijing 100044, China

5. Beijing Key Laboratory of Advanced Information Science and Network Technology, Beijing 100044, China

Abstract

We proposed an optical frequency domain reflectometry based on a multilayer perceptron. A classification multilayer perceptron was applied to train and grasp the fingerprint features of Rayleigh scattering spectrum in the optical fiber. The training set was constructed by moving the reference spectrum and adding the supplementary spectrum. Strain measurement was employed to verify the feasibility of the method. Compared with the traditional cross-correlation algorithm, the multilayer perceptron achieves a larger measurement range, better measurement accuracy, and is less time-consuming. To our knowledge, this is the first time that machine learning has been introduced into an optical frequency domain reflectometry system. Such thoughts and results would bring new knowledge and optimization to the optical frequency domain reflectometer system.

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Chongqing Talents: Exceptional Young Talents Project

National Science Fund for Distinguished Young Scholars

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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