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Distance Measurement Error in Time-of-Flight Sensors Due to Shot Noise

  • Published:2015-02-25 Issue:3 Volume:15 Page:4624-4642
  • ISSN:1424-8220
  • Container-title:Sensors
  • language:en
  • Short-container-title:Sensors

Author:

Illade-Quinteiro Julio,Brea Víctor,López Paula,Cabello Diego,Doménech-Asensi Gines

Funder

Xunta de Galicia

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference20 articles.

1. ToF Range-Imaging Cameras;Remondino,2013

2. Solid State time-of-flight camera;Lange;IEEE J. Quantum Electron,2001

3. Technology and device scaling considerations for CMOS imagers;Wong;IEEE Trans. Electron Devices,1996

4. Temperature-compensated capacitancefrequency converter with high resolution;Matko;Sens. Actuators A Phys,2014

5. CMOS image sensors: State-of-the-art;Theuwissen;Solid State Electron,2008

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1. Non-systematic noise reduction framework for ToF camera;Optics and Lasers in Engineering;2024-09

2. Analyzing the effect of shot noise in indirect Time-of-Flight cameras;Signal Processing: Image Communication;2024-03

3. Under-Display ToF Imaging with Efficient Transformer;2023 IEEE International Conference on Visual Communications and Image Processing (VCIP);2023-12-04

4. Method of depth simulation imaging and depth image super-resolution reconstruction for a 2D/3D compatible CMOS image sensor;Applied Optics;2023-06-02

5. A Novel Imaging Method for Two-Tap Pulsed-Based Indirect Time-of-Flight Sensor;IEEE Sensors Journal;2023-04-01
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