Synchrotron-Based X-ray Photoelectron Microscopy of LMO/LAGP/Cu Thin-Film Solid-State Lithium Metal Batteries

Author:

Kazemian Majid1,Amati Matteo2,Gregoratti Luca2,Kiskinova Maya2ORCID,Bozzini Benedetto3ORCID

Affiliation:

1. Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK

2. Elettra—Sinctrotrone Trieste S.C.p.A. S.S 14, km 163.5 in Area Science Park, 34149 Trieste-Basovizza, Italy

3. Department of Energy, Politecnico di Milano, Via Lambruschini 4, 20156 Milano, Italy

Abstract

Solid-state batteries (SSB), characterized by solid-state electrolytes—in particular inorganic ones (ISSE)—are an ideal option for the safe implementation of metallic Li anodes. Even though SSBs with ISSEs have been extensively investigated over the last two decades, they still exhibit a series of technological drawbacks. In fact, mechano-chemical issues, mainly the stability of the electrolyte/anode interface, hinder their widespread application. The present investigation focusses on a thin-film LMO (Lithium-Manganese-Oxide)/LAGP (LiAlGe Phosphate)/Copper, anodeless Lithium-metal battery and explores the morphochemical evolution of the electrode/electrolyte interfaces with synchrotron-based Scanning Photoelectron Microscopy (SPEM) of intact pristine and cycled cells. Chemical images were acquired with submicrometer resolution, to highlight the coupled geometrical and chemical-state changes caused by electrochemical ageing. Geometrical changes of the electrolyte/cathode interface were induced by periodic volume changes, causing de-cohesion of the solid-solid contact, but no chemical-state changes accompany the cathodic damaging mode. Instead, shape changes of the electrolyte/anode region pinpoint the correlation between mechanical damaging with the decomposition of the LAGP ISSE, due to the reduction of Ge, triggered by the contact with elemental Li. The micro-spectroscopic approach adopted in this study enabled the assessment of the highly localized nature of the cathodic and anodic degradation modes in SSB devices and to single out the chemical and mechanical contributions.

Funder

European Union Next-GenerationEU

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Electrochemistry,Energy Engineering and Power Technology

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