Origin of Temperature Coefficient of Resonance Frequency in Rutile Ti1−xZrxO2 Microwave Ceramics-Reference-Cited by-同舟云学术

Origin of Temperature Coefficient of Resonance Frequency in Rutile Ti1−xZrxO2 Microwave Ceramics

Published:2024-05-23 Issue:2 Volume:7 Page:698-711
ISSN:2571-6131
Container-title:Ceramics
language:en
Short-container-title:Ceramics

Author:

Khan Izaz¹,Khan Aneela¹,Muhammad Raz¹^ORCID,Mao Minmin²,Han Dandan³,Song Kaixin²^ORCID,Lei Wen⁴,Wang Dawei⁵^ORCID

Affiliation:

1. Department of Physics, Abdul Wali Khan University Mardan, Mardan 23200, Pakistan

2. College of Electronics and Information, Hangzhou Dianzi University, Hangzhou 310018, China

3. Key Laboratory for Special Functional Materials in Jilin Provincial Universities, Jilin Institute of Chemical Technology, Jilin 132022, China

4. School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China

5. School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150080, China

Abstract

In this study, we report the effect of Zr4+ doping on the optical energy gap and microwave dielectric properties of rutile TiO2. Rietveld analysis explicitly confirmed that Zr4+ occupies the octahedral site, forming a single-phase tetragonal structure below the solubility limit (x < 0.10). Notably, at x = 0.025, a significant enhancement in Q × fo was observed. This enhancement was attributed to the reduction in dielectric loss, associated with a decrease in oxygen vacancies and a lower concentration of Ti3+ paramagnetic centers. This conclusion was supported by Raman and electron paramagnetic resonance spectroscopy, respectively. The origin of high τf in rutile Ti1−xZrxO2 is explained on the basis of the octahedral distortion/tetragonality ratio, covalency, and bond strength.

Funder

Directorate General of Science and Technology

Publisher

MDPI AG

Link

https://www.mdpi.com/2571-6131/7/2/46/pdf

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